IC SOCKET, TEST SOCKET - SDK, JAPAN

Burn-In Test Socket (E/F/G/H Series)

Suitable for multi pins, despite the compact size.
Contact is suitable for high temperature and normal, which allows the best option for the environment to use socket.


PKG separating function against sticking is equipped.
Used by a large semi-conductor manufacturer.

 

Socket Basic Specs
Basic Specs
Contact Pressure 11-14g / pin (high temp)
17-22g / pin (normal temp)
Contact Resistance (default) 200-300momega
Durable Temperature -40 - +150C
Electric Current Capacity 0.6amp

 

バーインソケット

 

Socket Size  28.0mm X 22.0mm
  DIP SMT
Series E F
Hight 17.0mm (Socket Free)
14.0mm (Cover Full Stroke)
Pitch
[Matrix]]
0.4mm [29 X 29]
0.5mm [24 X 24]
0.65mm [19 X 20]
0.8mm [15 X 15]
1.0mm [12 X 12]
Max PKG Size 14.0mm x 14.0mm
Min PKG Size 4.0mm x 4.0mm

*MAX/MIN PKG Size may slightly varies on matrix.

 

Socket Size 26.0mm X 22.0mm
  DIP
Series G
Hight 17.5mm (Socket Free)
Pitch
[Matrix]
0.4mm [29 X 29]
0.5mm [24 X 24]
0.65mm [19 X 20]
0.8mm [15 X 15]
1.0mm [12 X 12]
Max PKG Size 14.0mm x 14.0mm
Min PKG Size 4.0mm x 4.0mm

*MAX/MIN PKG Size may slightly varies on matrix.

 

Socket Size 26.0mm X 25.0mm
  DIP
Series H
Hight 17.0mm (Socket Free)
Pitch
[Matrix]
0.5mm [24 X 31]
1.0mm [12 X 16]
Max PKG Size 14.0mm x 18.0mm
Min PKG Size 4.0mm x 4.0mm

*MAX/MIN PKG Size may slightly varies on matrix.

 

 

Burn In Socket

 

Burn In Test Socekt /IC Socket, Test Socket - SDK

 

 

 

 

On the IC guide of the socket, contact line up adapter and IC guide are separated and only IC guide part is cut and processed on the package shape, in order to fit to various devices.

 

This method makes it possible to cut initial cost and supply low volume in a short time, as there is no need to shape IC guide at every package.

IC Socket, Test Socket

 

IC Sockets, Test Sockets - SDK

 

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