SHONAN DENSHI KOGYO SDK Co., Ltd.

japanese page

tel : 0467-40-5567

 

Image Sensor Test Socket

  • Active IC guide feature can be incorporated to accurately align the optical center of the device with the socket center.
  • Almost all shapes of devices can be handled.
  • Roller style IC guide is available to prevent wear of the socket body caused by friction with the ceramic package.
  • Available both for volume ATE and for manual lab testing.
  • Multi-site testing can be supported.

Multi-functional Type Open-top Socket
Multi-functional Type Open-top Socket

Standard Type Open-top Socket
Standard Type Open-top Socket

- Open-top Socket with IC Centering Guide Feature

Open-top Socket with IC Centering Guide Feature

  • The IC centering feature using active PKG guides ensures accurate PKG alignment.

Latches open (Guides open)

Latches closed (Guides activated)

- Socket with IC Roller Guide Feature

Socket with IC Roller Guide Feature

  • The socket features the roller IC guide which prevents plastic of the socket guide from wearing by scrubbing with the ceramic package.

Socket with IC Roller Guide Feature

 

 

 


inquiry about ic socket, test soket, etc