SHONAN DENSHI KOGYO

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LD (Laser Diode) Aging Socket

  • LD aging socket enables the device to be tested in die form before packaged.
  • The emitted light is individually detected by photodiode.
  • Test cost can be reduced thanks to the capability of testing devices before packaged.


レーザーダイオード(LD)用エージングソケット

 

レーザーダイオード(LD)用エージングソケット

 

LED TEST SOCKET

  • LED Test Socket ensures easy handling (loading, unloading) of LED dies (including flip chip) before packaged.
  • Test process throughput can be significantly improved thanks to elimination of the additional process of wire bonding for testing packaged devices.
  • Using high temp. resistant materials with low thermal resistance to effectively dissipate heat from LED device.

 

LED TEST SOCKET

Socket

 

LED TEST SOCKET

Contact Point of LED Die

 

LED TEST SOCKET

LED emitting light

 

LED TEST SOCKET

Aging board with sockets installed.

 

Easy installation on the aging board

LED TEST SOCKET

Socket installed into the jig to be set up with the integrating sphere

 

Capable of testing the device with the integrating shere without removing the device from the socket after aging.


inquiry about ic socket, test soket, etc